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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM / by Ray F. Egerton.

By: Material type: TextTextPublication details: Switzerland: Springer, 2016Edition: 2nd edDescription: xi, 196 p.: ill.; 24 cmISBN:
  • 9783319819860
Subject(s): DDC classification:
  • 530.41 EGP
Online resources:
Contents:
An Introduction to Microscopy
Electron Optics
The Transmission Electron Microscope
TEM Specimens and Images
The Scanning Electron Microscope
Analytical Electron Microscopy
Special Topics
Appendix: Mathematical Derivations
Summary: This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy
Item type: Books
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Item type Current library Collection Shelving location Call number Copy number Status Date due Barcode
Books Books KU Central Library Rack No. : 17 Shelve No. : A-05 Reference Section (Non-Issuable Books) 530.41 EGP 2016 (Browse shelf(Opens below)) C-1 (NI) Not For Loan 53854
Books Books KU Central Library Rack No. : 17 Shelve No. : A-05 Reference Section (Non-Issuable Books) 530.41 EGP 2016 (Browse shelf(Opens below)) C-2 (NI) Not For Loan 53853

An Introduction to Microscopy

Electron Optics

The Transmission Electron Microscope

TEM Specimens and Images

The Scanning Electron Microscope

Analytical Electron Microscopy

Special Topics

Appendix: Mathematical Derivations

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy

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